US$ 15.00
C00358 - SEMI C3.58 - 八フッ化シクロブタン(C4F8),電子グレード,シリンダ充填,品質99.999%の仕様 Revision:SEMI C3.58-0303 - Superseded SEMI MF1188 –– Test Method
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Description
SEMI MF1188 –– Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption with Short Baseline
SEMI M61-0612 (Reapproved 0319)
Generic Services
SEMI C99-0320 (first published)
C00358 - SEMI C3.58 - 八フッ化シクロブタン(C4F8),電子グレード,シリンダ充填,品質99.999%の仕様 Revision:SEMI C3.58-0303 - Superseded SEMI MF1188 –– Test MethodNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI Gases Global Technical Committee2011912global Audits and Reviews Subcommittee201110www. semiviews. org www. semi. org20033 (C4F8) (C4F8) Referenced SEMI Standards None.
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